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New Test Method for the Pulse Immunity of Microcontrollers

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4 Author(s)
Tao Su ; Infineon Technol. AG, Neubiberg ; Markus Unger ; Thomas Steinecke ; Robert Weigel

The paper presents a new test method for pulse susceptibility of microcontrollers which reflects the electromagnetic environment of microcontrollers in practical applications. The method includes a set of electromagnetic interference pulses and their injection networks. The waveforms of the pulses are deduced from measurements on real application boards of microcontrollers.

Published in:

2007 IEEE International Symposium on Electromagnetic Compatibility

Date of Conference:

9-13 July 2007