System Maintenance:
There may be intermittent impact on performance while updates are in progress. We apologize for the inconvenience.
By Topic

Transparent-Test Methodologies for Random Access Memories Without/With ECC

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)

This paper presents a systematic procedure for transforming a bit-oriented March test into a transparent word-oriented March test. The test-time complexity of the transparent word-oriented March tests converted by the proposed method is only (P + 5 log2 B + 2)N for an N x B-bit Random Access Memory, and the test-time complexity of the corresponding signature-prediction test is QN. Here, P and Q denote the number of total Read/Write and Read test operations of the original bit-oriented March test. A transparent-test methodology for memories with error-correction code (ECC) is also proposed. This methodology can test and locate faulty cells, and no signature prediction is needed. The test-time complexity of the proposed transparent-test methodology for memories with ECC is only (P + 5 log2 B + 2) N.

Published in:

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:26 ,  Issue: 10 )