Close category search window
 

Static Analysis of Nano Fixed-Fixed Beam Based on Molecular Dynamics Simulation

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Na Gong ; Harbin Inst. of Technol., Harbin ; Yingchun Liang ; Bingguo Liu

In this paper, molecular dynamics simulation method is used to study static characteristic of nano fixed-fixed beam, which is used in nano-electric-mechanical switch. Firstly, model of solid beam and hollow beam are developed. The solid beam consists of 5times20times5 crystal cell, and dimension is 2.715 nm times 10.860 nm times 2.715 nm. For the hollow beam, its wall thickness is one crystal cell, the model consists of 5times20times5 crystal cells and 7times20times7 crystal cells. Then Tersoff potential function is used to compute the interaction of single crystal silicon atoms. The initial position is set on crystal lattice point and the initial speed is set to meet Boltzmann distribution. System freely calculates for period of time until it comes to balance. At last, beams are applied with external voltage to show bending deformation when the length of beam is 3.6 nm, 7 nm and 10 nm. Results show that: firstly, for solid beam, atom's position has a little deviation from the ideal lattice's position after relaxation, yet for hollow beam, the atom position is far from the ideal lattice and the section of beam is flat shape along diagonal line; then comparing simulation data with traditional theory data under uniform static load, it is found that two group data well conform to each other, only there are a few differences on the middle part of beam. The maximum difference is 0.050488 nm; at last, we discuss the effect for beam flexivity caused by length of beam. We found that the two end of beam only can affect no more than 2 nm long distance from the support base. More far from the support base is, the effect is less. So the longer nano beam is, the middle level distance is longer.

Published in:
Mechatronics and Automation, 2007. ICMA 2007. International Conference on

Date of Conference: 5-8 Aug. 2007

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.