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When designing devices at microwave frequencies, the characteristics of printed circuit board materials have to be well known in order to attain exact functionality. The characterization can be carried out with the microstrip T-resonator test method described in this paper. With the modifications presented by the authors, the microstrip T-resonator method can be applied with improved accuracy to dielectric characterization as well as to temperature dependence measurements of the printed circuit board materials. The results obtained with the microstrip T-resonator method are also compared to the results given by the microstrip ring resonator test method.