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The quality of measurements made in any system is quantified by supplying the expanded uncertainty of the result, as recommended in the Guide to Uncertainty in Measurement. In a system that involves analog-to-digital converters (ADCs), one of the sources of uncertainty is the converters gain and offset error. The uncertainty of these two parameters should be known in order to compute the uncertainty of the measurements made with the system. In this paper, we study the uncertainty of terminal-based defined gain and offset error that are estimated using a standard histogram test in the presence of an additive noise.
Instrumentation and Measurement, IEEE Transactions on (Volume:56 , Issue: 5 )
Date of Publication: Oct. 2007