Cart (Loading....) | Create Account
Close category search window

Improved Data Recovery from Patterned Media With Inherent Jitter Noise Using Low-Density Parity-Check Codes

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Ntokas, I.T. ; Univ. of Manchester, Manchester ; Nutter, P.W. ; Tjhai, C.J. ; Ahmed, M.Z.

Patterned magnetic media promises areal densities in excess of 1 Tbit/in2 for data storage. However, current imperfect patterning techniques result in a variation in the dimensions and distribution of the fabricated islands. As a result, this variation introduces jitter in the replay waveform that makes data recovery difficult. In this paper, we investigate the use of low-density parity-check (LDPC) codes and iterative decoding for mitigating the effects of lithography jitter and improving the read channel performance in patterned media storage systems. In addition, we show that the adoption of LDPC coding techniques permits an increase in the data storage capability of the medium to approximately 1.6 Tbit/in2 with acceptable bit-error-rate performance.

Published in:

Magnetics, IEEE Transactions on  (Volume:43 ,  Issue: 10 )

Date of Publication:

Oct. 2007

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.