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Conventional automatic test pattern generation (ATPG) algorithms fail when applied to asynchronous NULL convention logic (NCL) circuits due to the absence of a global clock and presence of more state-holding elements, leading to poor fault coverage. This paper presents a design-for-test (DFT) approach aimed at making asynchronous NCL designs testable using conventional ATPG programs. We propose an automatic DFT insertion flow (ADIF) methodology that performs scan and test point insertion on NCL designs to improve test coverage, using a custom ATPG library. Experimental results show significant increase in fault coverage for NCL cyclic and acyclic pipelined designs.
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on (Volume:15 , Issue: 10 )
Date of Publication: Oct. 2007