Close category search window
 

A Novel Framework for Test Domain Reduction using Extended Finite State Machine

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Ngamsaowaros, N. ; Thammasat Univ., Pathumthani ; Sophatsathit, P.

Test case generation is an expensive, tedious, and error- prone process in software testing. In this paper, test case generation is accomplished using an Extended Finite State Machine (EFSM). The proper domain representative along the specified path is selected based on fundamental calculus approximation. The pre/post-conditions of class behavior is derived from a continuous or piece-wise continuous function whose values are chosen from partitioned subdomains. Subsequent test data for the designated class can be generated from the selected test frames. In so doing, the domain is partitioned wherein reduced test cases are generated, yet insuring complete test coverage of the designated test plan. The proposed modeling technique will be conducive toward a new realm of test domain analysis. Its validity can also be procedurally proved by straightforward mathematical principles.

Published in:
Software Engineering Advances, 2007. ICSEA 2007. International Conference on

Date of Conference: 25-31 Aug. 2007

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.