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Simplified RF noise de-embedding method for on-wafer CMOS FET

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5 Author(s)
Xiong, Y.Z. ; Inst. of Microelectron., Singapore ; Issaoun, A. ; Nan, L. ; Shi, J.
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A simplified RF noise de-embedding method for an on-wafer CMOS device using only one dummy structure for simplicity and area reduction is presented. The method describes the use of a 'thru' test structure to subtract completely the parasitic effects of pads and in/out interconnections from the device under test. A comparison of the de-embedding results among the simplified method and existing de-embedding methods is given, which proves that the new method is effective, accurate and time efficient.

Published in:

Electronics Letters  (Volume:43 ,  Issue: 18 )

Date of Publication:

August 31 2007

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