Close category search window
 

A SQUID-Based Nondestructive Evaluation System for Testing Wires of Arbitrary Length

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Muck, M. ; Justus-Liebig-Univ. Giessen, Giessen ; Scholz, F.

The high field sensitivity of superconducting quantum interference devices (SQUIDs), especially at low frequencies, makes them ideally suited for applications in nondestructive evaluation. For testing of conducting wires, such as aluminum bond wire, we developed a special cryostat, which allows for pulling a wire of arbitrary length (which is kept at room temperature) through a niobium flux transformer connected to a niobium dc SQUID. The wire is excited by either passing an alternating current through it, or by exciting eddy-currents in the wire. The cryostat is made from a stainless steel inner vessel; the outer tube is from fiberglass. The gradiometric pickup loops are wound on a German-silver tube. As the wire under test is at room temperature, thermal noise produced by the wire is limiting the sensitivity of the system, rather than thermal noise produced by the stainless steel dewar.

Published in:
Applied Superconductivity, IEEE Transactions on  (Volume:17 ,  Issue: 3 )

Date of Publication: Sept. 2007

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.