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Chemical solution deposition, a very useful method for oxide film growth, is used to fabricate Y2Ti2O7 (YTO)-La2Zr2O7 (LZO) composite buffer layers on NiW (200) substrates. It is found that the orientation of the YTO layer is epitaxially related to the orientation of the LZO-NiW template. When YTO is prepared on a 900degC -annealed LZO layer, the orientation of the YTO is (222); however, the (400) oriented YTO layer is obtained when it is deposited on a 1000degC-annealed LZO-NiW template. These results suggest that the YTO orientation can be tuned by the LZO orientation and that YTO can be considered as one of the cap layers for coated conductors.