By Topic

Joint Failure Importance for Noncoherent Fault Trees

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Lixuan Lu ; Univ. of Ontario Inst. of Technol., Oshawa ; Jin Jiang

There exist several risk importance measures in the literature to rank the relative importance among basic events within a fault tree. Most of the importance measures indicate how important a basic event is with respect to the top event of the fault tree. However, the mutual influence among the basic events should also be considered. This is particularly true in practice when making maintenance decisions with a limited resource. This paper investigates the Joint Failure Importance (JFI), which reflects the interaction among basic events, namely, the change in the Birnbaum Importance of one basic event when the probability of another basic event changes. Even though the JFI for coherent fault trees and its properties have been examined in the literature, the results cannot be easily extended to noncoherent fault trees. The current work has shown that, for both coherent, and noncoherent fault trees, the sign of the JFI can provide useful information. However, the properties of the JFI for noncoherent fault trees are more complex, and do not always share with those for coherent fault trees. The Shutdown System Number One (SDS1) in a Canadian Deuterium-Uranium (CANDU) Nuclear Power Plant (NPP) is utilized to illustrate the theoretical results developed in this paper.

Published in:

Reliability, IEEE Transactions on  (Volume:56 ,  Issue: 3 )