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ESD Failures of Integrated Circuits and Their Diagnostics Using Transmission Line Pulsing

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3 Author(s)
Piatek, Z. ; Warsaw Univ. of Technol., Warsaw ; Kolodziejski, J.F. ; Pleskacz, W.A.

In the work typical ESD failures of integrated circuits and ESD testing methods are presented. Authors describe dependencies between ESD models and different ESD failures. In order to allow more advanced ESD testing of integrated circuits, transmission line pulsing is proposed and its correlation to HBM method described. Finally conclusions based on up-to-date research and test results obtained with the help of the assembled TLP tester are provided.

Published in:

Design and Diagnostics of Electronic Circuits and Systems, 2007. DDECS '07. IEEE

Date of Conference:

11-13 April 2007

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