Referenced Items are not available for this document.
Three-dimensional TCAD models are used in mixed- mode simulations to analyze the effectiveness of well contacts at mitigating parasitic PNP bipolar conduction due to a direct hit ion strike. 130 nm and 90 nm technology are simulated. Results show careful well contact design can improve mitigation. However, well contact effectiveness is seen to decrease from the 130 nm to the 90 nm simulations.
Published in:
Nuclear Science, IEEE Transactions on
(Volume:54
,
Issue:
4
)
Date of Publication: Aug. 2007
- Page(s):
- 894 - 897
- ISSN :
- 0018-9499
- INSPEC Accession Number:
- 9610121
- Digital Object Identifier :
- 10.1109/TNS.2007.895243
- Date of Current Version :
- 20 August 2007
- Issue Date :
- Aug. 2007
- Sponsored by :
- IEEE Nuclear and Plasma Sciences Society
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