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A New Approach to Estimate the Effect of Single Event Transients in Complex Circuits

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4 Author(s)
Aguirre, M.A. ; Sevilla Univ., Sevilla ; Baena, V. ; Tombs, J. ; Violante, M.

We describe an approach for analyzing single event transients (SETs) in complex digital circuits. The approach combines accuracy with efficiency: simulation is used for propagating the SET from the affected gate to flip-flops/latches, while hardware emulation is then used to study the resulting single or multiple-bit upset. To assess the capability of the proposed approach to deal with complex circuits, we analyzed the propagation of SETs in a microprocessor. In this paper, we analyzed the contribution to the error rate of different SET's pulse width, as well as the impact of the workload.

Published in:

Nuclear Science, IEEE Transactions on  (Volume:54 ,  Issue: 4 )

Date of Publication:

Aug. 2007

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