Cart (Loading....) | Create Account
Close category search window
 

Robustness Assessment of Life-Cycle-Management of CV Cables based on Degradation Diagnosis

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Kato, T. ; Department of Electrical Engineering and Computer Science, Nagoya University, Furo-cho, Chikusa-ku, Nagoya, 464-8603, Japan. E-mail: tkato@nuee.nagoya-u.ac.jp ; Suzuoki, Y.

Life-cycle management based on the degradation diagnosis is useful for preventing an unexpected failure and extending service life of electric power apparatuses, minimizing life-cycle cost. In our previous study, we formulated a numerical model of life-cycle management based on time-based maintenance and condition-based maintenance. Then, we applied the model for evaluating the economic effect of degradation diagnosis of power cables, assuming that the maximum length of water tree as a replacement criterion can be measured nondestructively. To carry out reliable life cycle management, however, accurate data on the relation between extent of degradation and failure probability or remaining life are necessary. In this study, we examine the influence of accuracy of the data used to determine the optimum diagnostic parameters and evaluate how the life-cycle cost is affected by the employment of inaccurate data. The results show that the condition-based maintenance with degradation diagnosis can be less subject to the accuracy of the back data and is possible to realize the reliable life-cycle management.

Published in:

Solid Dielectrics, 2007. ICSD '07. IEEE International Conference on

Date of Conference:

8-13 July 2007

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.