Referenced Items are not available for this document.
Characterizing the impact of variability on circuit performance measurements (delay, power, and signal integrity) is necessary to avoid chip failure. The authors present a comprehensive methodology for analyzing the impact of device and metal variations on the power supply noise, and hence the signal integrity, of on-chip power grids.
Published in:
Design & Test of Computers, IEEE
(Volume:24
,
Issue:
3
)
Date of Publication: May-June 2007
- Page(s):
- 256 - 266
- ISSN :
- 0740-7475
- INSPEC Accession Number:
- 9687095
- Digital Object Identifier :
- 10.1109/MDT.2007.61
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 13 August 2007
- Issue Date :
- May-June 2007
- Sponsored by :
- IEEE Council on Electronic Design and Automation
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