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Analysis of Power Supply Noise in the Presence of Process Variations

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2 Author(s)
Praveen Ghanta ; Arizona State University ; Sarma Vrudhula

Characterizing the impact of variability on circuit performance measurements (delay, power, and signal integrity) is necessary to avoid chip failure. The authors present a comprehensive methodology for analyzing the impact of device and metal variations on the power supply noise, and hence the signal integrity, of on-chip power grids.

Published in:

IEEE Design & Test of Computers  (Volume:24 ,  Issue: 3 )