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Power Grid Physics and Implications for CAD

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3 Author(s)
Pant, S. ; Michigan Univ., Ann Arbor ; Chiprout, E. ; Blaauw, D.

This article describes a full-die dynamic model of an Intel Pentium IV microprocessor design. The authors show that transient supply noise is sensitive to nonuniform decoupling-capacitor distribution, and that supply-drop locality is a tight function of frequency and package-die resonance, leading to significant localized resonant effects.

Published in:

Design & Test of Computers, IEEE  (Volume:24 ,  Issue: 3 )