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A Production IR-Drop Screen on a Chip

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4 Author(s)

Many modern designs have large, localized failures due to excessive power consumption, which can be measured as IR drop. The methodology described here employs an on-chip process-monitoring circuit that is easy to integrate on chip and use in a characterization or production environment, to help identify and localize IR-drop hot spots and power-related failures.

Published in:

Design & Test of Computers, IEEE  (Volume:24 ,  Issue: 3 )