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Drift reduction in ion-sensitive FETs using correlated double sampling

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3 Author(s)
B. Premanode ; Inst. of Biomed. Eng., London ; N. Silawan ; C. Toumazou

A discrete-time technique, correlated double sampling (CDS), as a method to reduce drift during ion-sensitive field effect transistor (ISFET) operation is presented. The CDS technique exploits switched capacitors to resolve low-frequency signal errors such as drift and 1/f noise, which are generated by an ISFET and its readout. In conjunction with post-processing, experimental results confirm drift reduction using this technique.

Published in:

Electronics Letters  (Volume:43 ,  Issue: 16 )