Cart (Loading....) | Create Account
Close category search window
 

A Source-Driven Error Recovery Scheme using Wyner-Ziv Coding

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Yongsheng Zhang ; Shanghai Jiao Tong Univ., Shanghai ; Hongkai Xiong ; Songyu Yu ; Hui Lv

In this paper, we propose an error recovery scheme to cope with the frame loss problem in large end-to-end delay scenario. Because Wyner-Ziv coding can produce deterministic output with nondeterministic inputs, we adopt the decoder's error-corrupted reference picture as side information to exploit its correlation with source picture, and thus improve the coding efficiency. To prevent retransmission request, we propose a feasible encoder-driven rate estimation scheme by only storing MVs and part of the error pattern at encoder. Furthermore, a new Laplacian parameter computing method is proposed based on discrete Laplacian PDF. The experimental results show that the proposed estimation schemes have quite high precision, and the error recovery scheme outperforms INTRA refresh scheme up to 5 dB.

Published in:

Multimedia and Expo, 2007 IEEE International Conference on

Date of Conference:

2-5 July 2007

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.