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We report on the design and testing of a novel two-stage wavelength-converter architecture, monolithically fabricated in indium phosphide. Two widely tunable integrated sampled-grating distributed Bragg reflector lasers are utilized on chip as probes in both converter stages. The architecture provides a first-stage tunable signal that is internal to the chip (lambdainternal), facilitating cascaded integration of wavelength-sensitive structures, or allowing wavelength conversion for cases where the input wavelength is equal to the output wavelength (lambdainput = lambdaoutput). Output wavelength tuning over 35 nm is shown, and error-free wavelength conversion for lambdainput = lambdaoutput is demonstrated for four wavelengths over a 20-nm range at 2.5 Gb/s. Dynamic range measurements show less than 2 dB of power penalty over a 15-dB variation in input power.