By Topic

Diagnostic Test of Large-Scale SFQ Shift Register

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

7 Author(s)
Hirotaka Terai ; Nat. Inst. of Inf. & Commun. Technol., Kobe ; Masamitsu Tanaka ; Yuuki Yamanashi ; Yoshihito Hashimoto
more authors

We diagnosed circuits to identify of margin reduction mechanisms in large-scale SFQ circuits. Two types of shift registers with partial or full bias line shields were designed and tested. We investigated the locations and origins of circuit errors by measuring bias margins and output waveforms. The results indicated that bias line currents can degrade the bias margin around the periphery in large-scale circuits with partial bias line shields. On the other hand, no apparent reduction of bias margins was observed in any part of the circuit area in the circuits with full bias line shields. However, we observed a reduction of the bias margin due to flux trapping even when we used a completely non-magnetic He dewar surrounded by a dual-layer permalloy metal shield. We found that the probability of finding a defect in a circuit with 10,000 Josephson junctions is less than 60%.

Published in:

IEEE Transactions on Applied Superconductivity  (Volume:17 ,  Issue: 2 )