By Topic

Timing Jitter Measurement in Single-Flux-Quantum Circuits Based on Time-to-Digital Converters With High Time-Resolution

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)

We evaluated timing jitter based on a time-to-digital converter (TDC) having sub-pico seconds time resolution. The measured jitter at liquid helium temperature was 65 fs for an optimally damped simple junction composing a conventional Josephson transmission line fabricated with the NEC standard process. The temperature dependence and shunt resistance dependence of jitter indicate that the jitter originates from thermal noise generated at the shunt resistor of the junction. We also found that the timing jitter of a balanced comparator is much larger than that of a JTL. The jitter of a balanced comparator is independent of temperature. This means that the jitter of a balanced comparator does not arise from thermal noise.

Published in:

Applied Superconductivity, IEEE Transactions on  (Volume:17 ,  Issue: 2 )