Scheduled System Maintenance on May 29th, 2015:
IEEE Xplore will be upgraded between 11:00 AM and 10:00 PM EDT. During this time there may be intermittent impact on performance. We apologize for any inconvenience.
By Topic

Measurement of Environmental Impedance at Plasma Frequency of Josephson Junction With Microwave Enhanced Thermal Escape

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Bo Mao ; Univ. of Kansas, Lawrence ; Siyuan Han

We have developed a simple and accurate method to determine the environmental impedance seen by a phase qubit at the plasma frequency of the junction by comparing the measured and simulated thermal escape rate in strong microwave field at 4.2 K. The results show that for our sample 1/Re[Y(omega)] is about 2.5 kOmega, where Re[Y(omega)] is the real part of the frequency-dependent environmental admittance.

Published in:

Applied Superconductivity, IEEE Transactions on  (Volume:17 ,  Issue: 2 )