By Topic

A New Symmetry Based Cluster Validity Index: Application to Satellite Image Segmentation

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Saha, S. ; Indian Stat. Inst., Kolkata ; Bandyopadhyay, S. ; Maulik, U.

An important approach for image segmentation is clustering the pixels based on their spectral properties. In this paper, a newly developed point symmetry distance is used to propose a new cluster validity index named S-index (Symmetry distance based index) which can provide a measure of goodness of clustering on different partitions of a data set. We have used one genetic clustering algorithm for partitioning the data set. Results demonstrating the superiority of the S-index in appropriately determining the number of clusters as compared to two other recently proposed measures, namely the PS index and PBM index, are provided for automatically classifying different landcover regions in remote sensing imagery.

Published in:

Information Technology, 2006. ICIT '06. 9th International Conference on

Date of Conference:

18-21 Dec. 2006