By Topic

Variation-Driven Device Sizing for Minimum Energy Sub-threshold Circuits

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Kwong, J. ; Massachusetts Inst. of Technol., Cambridge, MA ; Chandrakasan, A.P.

Sub-threshold operation is a compelling approach for energy-constrained applications, but increased sensitivity to variation must be mitigated. We explore variability metrics and the variation sensitivity of stacked device topologies. We show that upsizing is necessary to achieve robustness at reduced voltages and propose a design methodology to meet yield constraints. The need for upsizing imposes an energy-overhead, influencing the optimal supply voltage to minimize energy. Finally, we characterize performance variability by summing delay distributions of each stage in an arbitrary critical path and achieve results accurate to within 10% of Monte Carlo simulation

Published in:

Low Power Electronics and Design, 2006. ISLPED'06. Proceedings of the 2006 International Symposium on

Date of Conference:

4-6 Oct. 2006