Cart (Loading....) | Create Account
Close category search window

Systematic Characterization of Integrated Circuit Standard Components as Stimulated by Scanning Laser Beam

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Glowacki, A.M. ; Berlin Univ. of Technol., Berlin ; Brahma, S.K. ; Suzuki, H. ; Boit, C.

Laser stimulation (LS) has become a common technique of failure localization in integrated circuits (ICs). In optical-beam-induced resistivity change, thermally induced voltage alteration, Seebeck effect imaging, soft defect localization, etc., device modules with special passive and active device properties are the subject of stimulation effects. This paper investigates in detail the behavior and equivalent circuit models of most commonly used IC components, passives such as metal and polysilicon interconnect resistors and thermoelectric junctions, and actives like p-n diodes and field-effect transistors under illumination from both chip frontside and backside. The systematic characterization of the results improves the evaluation of LS analysis in failing circuits.

Published in:

Device and Materials Reliability, IEEE Transactions on  (Volume:7 ,  Issue: 1 )

Date of Publication:

March 2007

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.