Referenced Items are not available for this document.
In this paper, an improved compact OTFT model extending previous models into the subthreshold regime is presented. Two parameter extraction techniques using genetic algorithms (queen-bee and crossing-mates) are considered in order to determine the values of the main model parameters. The model and parameter extraction procedures are applied to a set of experimental measures in OTFTs from Infineon. Agreement between experimental and modelled DC I-V characteristics is excellent with both extraction methods but crossing-mates algorithm is faster and its results are more independent of the initial conditions.
Published in:
Electron Devices, 2007 Spanish Conference on
Date of Conference: Jan. 31 2007-Feb. 2 2007
- Page(s):
- 64 - 67
- Print ISBN:
- 1-4244-0868-7
- INSPEC Accession Number:
- 9739943
- Conference Location :
- Madrid
- Digital Object Identifier :
- 10.1109/SCED.2007.383996
- Product Type:
- Conference Publications
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