Cart (Loading....) | Create Account
Close category search window
 

Mining software repositories for traceability links

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Kagdi, H. ; Dept. of Comput. Sci., Kent State Univ., Kent, OH ; Maletic, J.I. ; Sharif, B.

An approach to recover/discover traceability links between software artifacts via the examination of a software system's version history is presented. A heuristic-based approach that uses sequential-pattern mining is applied to the commits in software repositories for uncovering highly frequent co-changing sets of artifacts (e.g., source code and documentation). If different types of files are committed together with high frequency then there is a high probability that they have a traceability link between them. The approach is evaluated on a number of versions of the open source system KDE. As a validation step, the discovered links are used to predict similar changes in the newer versions of the same system. The results show highly precision predictions of certain types of traceability links.

Published in:

Program Comprehension, 2007. ICPC '07. 15th IEEE International Conference on

Date of Conference:

26-29 June 2007

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.