Cart (Loading....) | Create Account
Close category search window
 

ITD-DFE Based Channel Estimation and Equalization in TDS-OFDM Receivers

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Guanghui Liu ; Samsung Electron. Co. Ltd., Suwon ; Junling Zhang

As an alternative to the traditional cyclic prefixed OFDM (CP-OFDM) technology, time-domain synchronous OFDM (TDS-OFDM) provides higher spectrum efficiency due to no pilot in the transmitted signal. However, the pilot-Aided channel estimation techniques in CP-OFDM cannot be applied to TDS-OFDM. In this paper, channel impulse responses are estimated in time domain based on the linear correlation between the received samples and the locally generated PN sequence. The iterative threshold detection (ITD), as well as the combination with decision feedback equalization (DFE), is proposed to improve the precision of channel estimation. It is shown by simulation that the proposed algorithm, ITD combined with DFE (ITD-DFE), performs very well even in multipath environments with long- delay and large-amplitude echoes.

Published in:

Consumer Electronics, IEEE Transactions on  (Volume:53 ,  Issue: 2 )

Date of Publication:

May 2007

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.