Close category search window
 

Feature Selection for Troubleshooting in Complex Assembly Lines

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Pfingsten, T. ; Max Planck Inst. for Biol. Cybern., Tubingen ; Herrmann, D.J.L. ; Schnitzler, T. ; Feustel, A.
more authors

The final properties of sophisticated products can be affected by many unapparent dependencies within the manufacturing process, and the products' integrity can often only be checked in a final measurement. Troubleshooting can therefore be very tedious if not impossible in large assembly lines. In this paper, we show that feature selection is an efficient tool for serial-grouped lines to reveal causes for irregularities in product attributes.

Published in:
Automation Science and Engineering, IEEE Transactions on  (Volume:4 ,  Issue: 3 )

Date of Publication: July 2007

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.