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Analysis of the Output Noise Voltage in CMOS Image Sensor Readout Circuit

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5 Author(s)
Youngchang Yoon ; Student Member, IEEE, School of Electrical Engineering and Computer Science, Seoul National University #059, San 56-1, Shillim-dong, Kwanak-ku, Seoul 151-744, Korea. Email: ; Hochul Lee ; Byung-Gook Park ; Jong Duk Lee
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This work helps to predict the output noise voltage of the CMOS image sensor read out circuit based on analytic equation and noise measurement results. With this result, the relative portion of the low frequency noise and thermal noise was calculated. As a result, this work can give an idea for reducing noise voltage magnitude of the readout circuit.

Published in:

2006 IEEE International Conference on Semiconductor Electronics

Date of Conference:

Oct. 29 2006-Dec. 1 2006