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Built-in Self Testing of a DRP-Based GSM Transmitter

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4 Author(s)

We present a novel approach for built-in self-testing (BIST) of an RF wireless transmitter. This approach, based on fully-digital hardware and on software algorithms, allows the testing of the transmitter's analog/RF circuitry while providing low-cost replacements for the costly traditional RF tests. The testing approach is structural in nature and substitutes for the commonly employed RF performance testing of high-cost test equipment and extended test times. The test coverage achieved for the analog circuitry is maximized to approach 100% and the test-time and associated test costs are minimized. The presented techniques have been successfully verified in a commercial 90 nm CMOS single-chip GSM radio based on the Digital RF Processor (DRPtrade) technology.

Published in:

Radio Frequency Integrated Circuits (RFIC) Symposium, 2007 IEEE

Date of Conference:

3-5 June 2007