Cart (Loading....) | Create Account
Close category search window
 

Timing-Driven Redundant Contact Insertion for Standard Cell Yield Enhancement

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Iizuka, T. ; Tokyo Univ., Tokyo ; Ikeda, M. ; Asada, K.

This paper proposes an automatic redundant contact insertion method under timing constraints for standard cell yield enhancement. Contact failure is one of the most dominant yield loss reasons and redundant contact insertion is highly recommended to improve the yield. The proposed method inserts the redundant contacts as many as possible under given timing constraints using a linear Programming. The area constraint can be given during redundant contact insertion simultaneously. Experimental results show that we can analyze the trade-off between performance and the number of the redundant contacts, and can pick up the yield variants from the trade-off curve. These yield variants of the original cells are used as a yield-enhanced cell library which is essential to realize yield-aware VLSI design flows.

Published in:

Electronics, Circuits and Systems, 2006. ICECS '06. 13th IEEE International Conference on

Date of Conference:

10-13 Dec. 2006

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.