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A low noise amplifier designed in a 0.13 mum CMOS VLSI technology is presented, which has self-test capabilities in order to monitor its behavior within a ZigBee sensor network during its life time. The silicon area required for both the built-in self test circuitry and the LNA has been optimized in order to reduce the overall cost of the function, using a shunt-feedback topology. The LNA provides a measured power gain of 10 dBm and a 2.4 dB noise figure, while consuming only 3.6 mW under a 1.2 V power supply. The test chip has been designed for robustness to fit a mass production requirements. The test chip demonstrates that the addition of the self-test circuitry has no impact on the LNA performances, while being efficient.
Date of Conference: 10-13 Dec. 2006