Referenced Items are not available for this document.
As the chip dimensions increase with chip complexity, interconnects tend to get longer. With the longer on-chip interconnects coupled with a decrease in wire width and wire separation, inductive coupling effects have become non-negligible. Analytical modelling expressions for the estimation of the noise peak voltage of the victim line under worst-case crosstalk noise effect are presented.
Published in:
Electronics, Circuits and Systems, 2006. ICECS '06. 13th IEEE International Conference on
Date of Conference: 10-13 Dec. 2006
- Page(s):
- 1 - 4
- E-ISBN :
- 1-4244-0395-2
- Print ISBN:
- 1-4244-0395-2
- INSPEC Accession Number:
- 9703408
- Conference Location :
- Nice
- Digital Object Identifier :
- 10.1109/ICECS.2006.379666
- Product Type:
- Conference Publications
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