By Topic

Efficient Skyline and Top-k Retrieval in Subspaces

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Yufei Tao ; Chinese Univ. of Hong Kong, Sha Tin ; Xiaokui Xiao ; Jian Pei

Skyline and top-k queries are two popular operations for preference retrieval. In practice, applications that require these operations usually provide numerous candidate attributes, whereas, depending on their interests, users may issue queries regarding different subsets of the dimensions. The existing algorithms are inadequate for subspace skyline/top-k search because they have at least one of the following defects: 1) they require scanning the entire database at least once, 2) they are optimized for one subspace but incur significant overhead for other subspaces, or 3) they demand expensive maintenance cost or space consumption. In this paper, we propose a technique SUBSKY, which settles both types of queries by using purely relational technologies. The core of SUBSKY is a transformation that converts multidimensional data to one-dimensional (1D) values. These values are indexed by a simple B-tree, which allows us to answer subspace queries by accessing a fraction of the database. SUBSKY entails low maintenance overhead, which equals the cost of updating a traditional B-tree. Extensive experiments with real data confirm that our technique outperforms alternative solutions significantly in both efficiency and scalability.

Published in:

Knowledge and Data Engineering, IEEE Transactions on  (Volume:19 ,  Issue: 8 )