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In this study, the effect of magnetic recording layer thickness on media performance in CoCrPtO perpendicular media was investigated. The thin films were reactively sputter-deposited on NiP-coated Al substrates. Ru/Ta was used as an interlayer and the total thickness of the synthetic antiferromagnetically-coupled SUL was 140 nm. The CoCrPtO layer thickness was varied from 2 to 27 nm. Saturation magnetization (Ms) of the CoCrPtO layer, obtained from a slope of saturation magnetization per unit area versus media thickness (tMAG), was 450 emu/cm3. The film orientation and microstructure were investigated by X-ray diffraction (XRD) and transmission electron microscopy (TEM). Polar magneto-optic Kerr effect (MOKE) magnetometer and vibrating sample magnetometer (VSM) were used to measure the magnetic properties. Recording performance was evaluated by using a spin-stand tester with a single-pole-type writer and a GMR reader.