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IBM has taken several steps in developing an analysis and optimization framework for VLSI layouts. We have deployed automated tools to reduce the sensitivity of designs to certain defect mechanisms in the manufacturing process. We see a clear need for expanding and refining tMs work and then integrating it with rigorous characterization of manufacturing processes and at the same time developing and integrating an overall trade-off theory showing the interaction of different layout-based yield-enhancement actions.
Date of Conference: 11-12 June 2007