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New approach to analysing conductor-dielectric periodic structures

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1 Author(s)
Tian-Lin Dong ; Huazhong University of Science & Technology, Department of Electronics & Information, Wuchang, China

A new approach to analysing conductor-dielectric periodic structures is presented. The formulations can take the transverse resonance conditions in both conductor and dielectric segments and the effects of their thickness into account. The measurements of the frequency-scanning characteristics of a leaky-wave antenna are in good agreement with the theory.

Published in:

Electronics Letters  (Volume:23 ,  Issue: 23 )