By Topic

Resistance of Ti:LiNbO3 devices to ionising radiation

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Drummond, E.I. ; Plessey Research (Caswell) Limited, Allen Clark Research Centre, Towcester, UK

Optical waveguide devices of titanium diffused into lithium niobate were exposed to ¿105rad of 2.25 MeV ß particles and 35 keV X-rays. At a wavelength of 1.3¿m, no change was detected in transmission or coupling between adjacent guides, either during or after irradiation.

Published in:

Electronics Letters  (Volume:23 ,  Issue: 23 )