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Partitioning for pseudo-exhaustive testing is NP-complete

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3 Author(s)
W. Song ; University of Toronto, Department of Electrical Engineering, Toronto, Canada ; K. C. Smith ; W. M. Snelgrove

In the letter, two schemes of circuit partitioning for pseudo-exhaustive testing are described. The complexities of both are proved to be NP-complete.

Published in:

Electronics Letters  (Volume:23 ,  Issue: 20 )