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Microwave holographic technique for reflector antenna profile measurement

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2 Author(s)
Grattan, C.L. ; University of Sheffield, Department of Electronic & Electrical Engineering, Sheffield, UK ; Bennett, J.C.

A short-range microwave holographic technique for the measurement of reflector antenna surface profile is described. The technique uses a linearly scanned transmit/receive CW probe located on-axis at approximately two focal lengths from the reflector vertex. Rotation of the reflector provides a plane-polar data set which can be reconstructed by a fast algorithm to provide a surface profile error map. No special precautions are required with regard to the reflectivity of the environment. Practical results are provided to illustrate the performance of the system.

Published in:

Electronics Letters  (Volume:22 ,  Issue: 19 )