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A short-range microwave holographic technique for the measurement of reflector antenna surface profile is described. The technique uses a linearly scanned transmit/receive CW probe located on-axis at approximately two focal lengths from the reflector vertex. Rotation of the reflector provides a plane-polar data set which can be reconstructed by a fast algorithm to provide a surface profile error map. No special precautions are required with regard to the reflectivity of the environment. Practical results are provided to illustrate the performance of the system.