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Differential amplitude imaging in scanning optical microscope

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2 Author(s)
See, C.W. ; University College London, Department of Electrical Engineering, London, UK ; Iravani, M.Vaez

A differential amplitude scanning optical microscope (DASOM) is described. The system, which uses a simple optical and electronic arrangement, is capable of detecting variations in optical reflectivity of 9 × 10¿6 in a 10kHz bandwidth. Results of surface studies of polished stainless steel and of natural diamond are presented.

Published in:

Electronics Letters  (Volume:22 ,  Issue: 18 )

Date of Publication:

August 28 1986

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