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Gate propagation delay and logic timing of GaAs integrated circuits measured by electro-optic sampling

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4 Author(s)
Rodwell, M.J.W. ; Stanford University, Edward L. Ginzton Laboratory, Stanford, USA ; Weingarten, K.J. ; Freeman, J.L. ; Bloom, D.M.

We report techniques for measuring internal switching delays of GaAs digital integrated circuits by electro-optic sampling. Circuit propagation delays of 15 ps are measured. A new phase modulation technique which allows testing of sequential logic is demonstrated with the measurement of a 2·7 GHz 8-phase clock generator.

Published in:

Electronics Letters  (Volume:22 ,  Issue: 9 )