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Measurement of on-chip waveforms and pulse propagation in digital GaAs integrated circuits by picosecond electro-optic sampling

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2 Author(s)
X. -C. Zhang ; Amoco Corporation, Naperville, USA ; R. K. Jain

We demonstrate precise measurement of sub-100 ps rise time on-chip electrical waveforms and of pulse propagation in digital GaAs integrated circuits with the use of picosecond electro-optic sampling. These experiments yield the first non-invasive measurement of single-gate propagation delays via direct and precise observation of on-chip waveforms at the input and output of individual logic gates internal to an integrated circuit.

Published in:

Electronics Letters  (Volume:22 ,  Issue: 5 )