Referenced Items are not available for this document.
We demonstrate precise measurement of sub-100 ps rise time on-chip electrical waveforms and of pulse propagation in digital GaAs integrated circuits with the use of picosecond electro-optic sampling. These experiments yield the first non-invasive measurement of single-gate propagation delays via direct and precise observation of on-chip waveforms at the input and output of individual logic gates internal to an integrated circuit.
Published in:
Electronics Letters
(Volume:22
,
Issue:
5
)
Date of Publication: February 27 1986
- Page(s):
- 264 - 265
- ISSN :
- 0013-5194
- Digital Object Identifier :
- 10.1049/el:19860181
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 11 July 2007
- Issue Date :
- February 27 1986
- Sponsored by :
- Institution of Engineering and Technology
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