Soft Error Mitigation in Switch Modules of SRAM-based FPGAs

In this paper, we propose two techniques to mitigate soft error effects on the switch modules of SRAM-based FPGAs: 1) The first technique tolerates SEU-caused open errors based on a new programming method for SRAM-bits of switch modules, and 2) The second technique mitigates SEU-cause short errors in the switch modules based on a mixed programmable and hard-wired switch module structure in the FPGAs. The effects of these two techniques on the delay, area and power consumption for 20 MCNC benchmark circuits are achieved using a minor modification in VPR and T-VPack FPGA CAD tools. The experimental results show that he first technique increase reliability of connections of switch module up to 30% while the second technique decreases the susceptibility of switch modules to SEUs about 50% compared to the traditional ones.