By Topic

A Multilayer Data Copy Test Data Compression Scheme for Reducing Shifting-in Power for Multiple Scan Design

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)

The random-like filling strategy pursuing high compression for today's popular test compression schemes introduces large test power. To achieve high compression in conjunction with reducing test power for multiple-scan-chain designs is even harder and very few works were dedicated to solve this problem. This paper proposes and demonstrates a multilayer data copy (MDC) scheme for test compression as well as test power reduction for multiple-scan-chain designs. The scheme utilizes a decoding buffer, which supports fast loading using previous loaded data, to achieve test data compression and test power reduction at the same time. The scheme can be applied automatic test pattern generation (ATPG)-independently or to be incorporated in an ATPG to generate highly compressible and power efficient test sets. Experiment results on benchmarks show that test sets generated by the scheme had large compression and power saving with only a small area design overhead.

Published in:

Very Large Scale Integration (VLSI) Systems, IEEE Transactions on  (Volume:15 ,  Issue: 7 )